Product Details:

NI PXI-4130 is a 3U single-slot PXI source measure unit, and this smu module integrates programmable sourcing and precise measurement functions to support semiconductor characterization and DC parameter testing for electronic components. It adopts four-quadrant operation design, which can source and sink power simultaneously, making it suitable for devices that need bidirectional power excitation and synchronous voltage-current reading. It is widely used for diode and transistor I-V curve testing, LED performance verification, battery small-signal characterization, passive component inspection, power device validation and automated production binning test. Engineers can develop test sequences with LabVIEW, NI-DCPower driver and NI TestStand, and remote sense function eliminates cable voltage drop error to guarantee stable precision power sweeping results on the device under test.

Key specifications and parameters: Main isolated SMU channel supports ±20 V voltage range and ±2 A current, maximum sourcing power reaches 40 W and sinking power up to 10 W. It provides five selectable current ranges from 200 µA to 2 A, with ultra-fine current measurement resolution down to 1 nA. An additional utility channel offers 0–6 V, 1 A auxiliary power output for supporting bias supply. The maximum sampling and update rate is 3 kS/s, and it supports constant voltage and constant current modes with configurable compliance limits. It carries 60 VDC channel-to-earth isolation and four-wire remote sense for high-accuracy measurement. The front panel uses MINI-COMBICON connectors for wiring, compatible with 16 AWG to 28 AWG wires. It is powered by PXI chassis backplane plus optional APS-4100 auxiliary power supply. The operating temperature range is 0 ℃ to 55 ℃, storage temperature -20 ℃ to 70 ℃, 10%–90% non-condensing humidity. Status indicators help users check output, trigger and fault conditions quickly during test debugging.

This pxi component test module is an end-of-life legacy NI test instrument. We supply fully inspected and calibrated refurbished units for replacement and upgrade of old semiconductor test benches and laboratory characterization systems. It can be combined with other PXI digital modules, switch cards and chassis to build compact ATE systems. It is widely adopted in semiconductor labs, optoelectronic component factories, automotive electronics verification and university research measurement platforms. As a classic four-quadrant SMU, it delivers reliable DC sweeping and parameter extraction for long-term component characterization projects.