Product Details

The NI PCI-6250 is a high-speed M-series multifunction DAQ card developed for PCI bus dynamic test and measurement systems. It supports 16 single-ended or 8 differential analog input channels with 16-bit resolution, the single-channel maximum sampling rate reaches 1.25 MS/s and the aggregate multichannel scanning rate is 1 MS/s. This model does not integrate analog output channels, focusing on fast analog input acquisition. It is equipped with 24 TTL-compatible digital I/O lines and two independent 32-bit, 80 MHz counter-timer channels. Users can select seven programmable voltage ranges including ±0.1 V, ±0.2 V, ±0.5 V, ±1 V, ±2 V, ±5 V and ±10 V to match different sensor signal levels. It adopts NI-MCal calibration technology to stabilize long-term measurement accuracy, and the 100 dB CMRR effectively suppresses power frequency noise and common-mode interference in laboratory and light industrial environments. The onboard 4095-sample FIFO buffer ensures stable continuous data streaming and reduces data loss risk during high-speed multi-channel scanning tasks. Compared with standard 250kS/s M-series boards, this card delivers much faster sampling performance for capturing transient and fast-changing signals.

This DAQ card uses a 68-pin VHDCI signal connector for all I/O wiring, compatible with matched shielded cables and terminal blocks for low-level signal measurement. It supports analog triggering, digital triggering and flexible clock configuration. Users can synchronize this card with other NI DAQ hardware via the RTSI bus to build multi-board coordinated test systems. The dual 32-bit counter channels can complete pulse counting, frequency measurement, period capture and incremental encoder signal monitoring. Digital I/O lines can read external status signals and drive low-power TTL circuits for trigger routing and simple interlock control, and part of digital lines support hardware-timed operation. It supports DMA data transmission to reduce CPU occupancy during continuous high-speed sampling, and built-in self-calibration compensates gain and offset drift to maintain stable measurement accuracy for long-running dynamic logging tasks.

This multifunction daq card is widely used in transient signal capture, vibration and shock testing, ultrasonic measurement, product design verification, high-speed manufacturing test stations, strain dynamic acquisition and OEM high-speed measurement equipment integration. It supports NI-DAQmx drivers, compatible with LabVIEW, LabWindows/CVI and C/C++ programming environments, so engineers can quickly develop high-speed multi-channel data acquisition programs. As a discontinued legacy M-series DAQ hardware, the PCI-6250 is mainly used for maintenance and spare replacement of existing high-speed measurement platforms. It can maintain reliable fast scanning performance, retain mature test workflows and avoid the high cost of rebuilding the whole measurement system. Its operating temperature range is 0°C to 55°C, supporting stable continuous operation in laboratory and light industrial environments.