Product Details

The NI PCI-6070E, also named PCI-MIO-16E-1, is a top-tier high-speed E-series multifunction DAQ card built for PCI bus measurement and test systems, designed for fast transient analog acquisition and synchronous stimulus-response testing. It adopts successive approximation ADC architecture with 12-bit resolution, supporting 16 single-ended analog input channels or 8 software-selectable differential analog input channels, and the maximum single-channel sampling rate reaches 1.25 MS/s. It is equipped with 2 analog output channels, 8 bidirectional TTL digital I/O lines and two independent 24-bit counter-timer channels. The analog input provides abundant programmable bipolar and unipolar voltage ranges from ±50 mV to ±10 V, which can adapt to different sensor output levels. Differential input configuration delivers excellent common-mode rejection capability to filter ground loop noise and electromagnetic interference in complex industrial wiring environments. The onboard large FIFO buffer ensures stable continuous data streaming and effectively reduces data loss during ultra-fast sampling for dynamic signal capture.

This DAQ card uses a 68-pin SCSI connector for all signal wiring, compatible with shielded cables, SCC and SCXI signal conditioning accessories for isolated, high-voltage and remote sensor measurement. It supports software trigger and external hardware trigger for analog scanning, and the RTSI synchronization bus enables clock and trigger sharing with other NI DAQ, digitizer and DSA hardware to build multi-board synchronized test systems. The dual 24-bit counter channels can perform pulse counting, frequency measurement, period capture and incremental encoder signal monitoring. The analog output channels can generate stable DC voltage and fast analog excitation signals, cooperating with analog input channels to complete sensor calibration, frequency response inspection and high-speed closed-loop dynamic testing. Digital I/O lines can read external status signals and drive low-power TTL circuits for interlock control and status indication. The standard PCI form factor fits ordinary industrial PC chassis and uses bus-powered design without extra external power supply. It supports DMA data transmission to reduce CPU load during continuous high-speed logging, and built-in self-calibration function compensates gain and offset drift to maintain stable measurement accuracy for long-running tests.

This multifunction daq card is widely used in automotive component testing, transient pressure and vibration measurement, electronic product validation, high-speed manufacturing test stations, impulse signal monitoring, OEM high-speed measurement equipment integration and aerospace component dynamic verification. It supports both traditional NI-DAQ and NI-DAQmx drivers, compatible with LabVIEW, LabWindows/CVI and C/C++ programming environments, so engineers can quickly develop high-speed integrated acquisition and control programs. As a discontinued legacy E-series DAQ hardware, the PCI-6070E is mainly used for maintenance and spare replacement of existing high-speed measurement platforms. It can maintain stable synchronous analog input and output performance, retain mature test workflows and avoid the high cost of rebuilding the whole measurement system. Its operating temperature range is 0°C to 55°C, supporting reliable continuous operation in laboratory and light industrial environments.