Product Details

The NI PCI-6040E, also known as PCI-MIO-16E-4, is a high-speed E-series multifunction DAQ card built for PCI bus measurement systems, designed for dynamic analog acquisition and stimulus-response automated testing. It adopts 12-bit ADC resolution, supporting 16 single-ended analog input channels or 8 differential analog input channels. It achieves 500 kS/s sampling rate for single channel and 250 kS/s aggregate sampling rate for multichannel scanning. It comes with 2 analog output channels, 8 bidirectional TTL digital I/O lines and two independent 24-bit counter-timer channels. The analog input supports multiple programmable bipolar voltage ranges, and differential input wiring provides excellent common-mode rejection to suppress ground loop noise and electromagnetic interference in industrial wiring environments. The onboard FIFO buffer ensures stable data streaming and reduces the risk of data loss during continuous high-speed sampling.

This DAQ card uses a 68-pin SCSI connector for all signal wiring, compatible with shielded cables, SCC and SCXI signal conditioning accessories for isolated, high-voltage and remote sensor measurement. It supports software trigger and external hardware trigger for analog scanning, and the RTSI synchronization bus enables clock and trigger sharing with other NI DAQ, digitizer and DSA hardware to build multi-board synchronized test systems. The dual 24-bit counter channels can perform pulse counting, frequency measurement, period capture and incremental encoder signal monitoring. The analog output channels can generate stable DC voltage and analog excitation signals, cooperating with analog input channels to complete sensor calibration, frequency response inspection and dynamic closed-loop testing. Digital I/O lines can read external status signals and drive low-power TTL circuits for interlock control and status indication. The standard PCI form factor fits ordinary industrial PC chassis and uses bus-powered design without extra external power supply. It supports DMA data transmission to reduce CPU load during continuous data logging, and built-in self-calibration function compensates gain and offset drift to maintain stable measurement accuracy for long-running tests.

This multifunction daq card is widely used in dynamic signal testing, transient response measurement, electronic component verification, small batch manufacturing test stations, vibration and pressure sensor testing, OEM high-speed measurement equipment integration and aerospace component validation. It supports both traditional NI-DAQ and NI-DAQmx drivers, compatible with LabVIEW, LabWindows/CVI and C/C++ programming environments, so engineers can quickly develop integrated acquisition and control programs. As a discontinued legacy E-series DAQ hardware, the PCI-6040E is mainly used for maintenance and spare replacement of existing high-speed measurement platforms. It can maintain stable synchronous analog input and output performance, retain mature test workflows and avoid the high cost of rebuilding the whole measurement system. Its operating temperature range is 0°C to 55°C, supporting reliable continuous operation in laboratory and light industrial environments.