Product Details

The NI PCI-6034E is a high-speed E-series multifunction DAQ card for PCI bus measurement systems, designed for high-resolution analog voltage acquisition and digital monitoring tasks. It adopts successive approximation ADC with 16-bit resolution, supporting 16 single-ended analog input channels or 8 software-selectable differential analog input channels, with a maximum aggregate sampling rate of 200 kS/s. This model does not integrate analog output channels, focusing on high-speed analog input measurement, 8 bidirectional TTL digital I/O lines and two independent 24-bit counter-timer channels. The analog input supports multiple programmable bipolar voltage ranges from ±100 mV to ±10 V. Differential input mode provides excellent common-mode rejection capability to suppress ground loop noise and electromagnetic interference, which is suitable for capturing low-level sensor signals in noisy industrial wiring environments. The onboard 512-sample FIFO buffer helps smooth data streaming and reduce data loss during continuous scanning.

This DAQ card uses a 68-pin SCSI connector for all signal wiring, compatible with shielded cables, SCC and SCXI signal conditioning accessories for isolated, high-voltage and remote sensor measurement. It supports software trigger and external hardware trigger for analog scanning, and the RTSI synchronization bus enables clock and trigger sharing with other NI DAQ, digitizer and DSA hardware to build multi-board synchronized test systems. The dual 24-bit counter channels can perform pulse counting, frequency measurement, period capture and incremental encoder signal monitoring. Digital I/O lines can read external status signals and drive low-power TTL circuits for interlock control and status indication. The standard PCI form factor fits ordinary industrial PC chassis and uses bus-powered design without extra external power supply. It supports DMA data transmission to reduce CPU load during continuous data logging, and built-in self-calibration function compensates gain and offset drift to maintain stable measurement accuracy for long-running tests.

This multifunction daq card is widely used in laboratory dynamic signal acquisition, strain and pressure sensor testing, small batch manufacturing test stations, environmental parameter logging, OEM high-speed measurement equipment integration and component transient response verification. It supports both traditional NI-DAQ and NI-DAQmx drivers, compatible with LabVIEW, LabWindows/CVI and C/C++ programming environments, so engineers can quickly develop customized high-speed acquisition programs. As a discontinued legacy E-series DAQ hardware, the PCI-6034E is mainly used for maintenance and spare replacement of existing high-speed measurement platforms. It can maintain stable high-speed scanning and counter monitoring performance, retain mature test workflows and avoid the high cost of rebuilding the whole measurement system. Its operating temperature range is 0°C to 55°C, supporting reliable continuous operation in laboratory and light industrial environments.