Product Details:

NI 6723 is a high-density 13-bit analog output DAQ module available in PCI and PXI form factors, and this analog output module delivers stable waveform generation and voltage stimulus for automated test and signal simulation systems. It is designed to output synchronized analog voltage signals to replicate sensor feedback, drive actuators and build stimulus-response test loops. It is widely used for automotive ECU simulation, aerospace ground test, electronic component validation, PID control simulation, arbitrary waveform playback and production line calibration. Engineers can configure waveform profiles, trigger timing and channel parameters via LabVIEW and NI-DAQmx driver, supporting both continuous waveform streaming and static voltage output, which makes this multi-channel analog sourcing unit flexible for different test scenarios.

Key specifications and parameters: 32 analog voltage output channels, 13-bit DAC resolution, voltage range from -10 V to +10 V. The maximum single-channel update rate reaches 800 kS/s, and the sustained multi-channel update rate depends on FIFO buffer configuration. It comes with 8 channels of 5 V TTL digital I/O for trigger interlock and status handshake, plus two 24-bit 20 MHz counter-timers for pulse generation and timing control. It supports external clock and digital triggering to synchronize with other DAQ cards, switches and measurement instruments. Each channel can supply up to ±5 mA, with short-circuit protection to ground. The onboard FIFO buffer ensures smooth waveform playback without frequent host memory interaction. It uses dual 68-pin VHDCI connectors, compatible with SH68-C68-S shielded cables and SCB-68 terminal blocks for clean field wiring. The operating temperature range is 0 ℃ to 55 ℃, storage temperature -20 ℃ to 70 ℃, 10%–90% non-condensing humidity. The power-on default state is near 0 V, which helps meet safety requirements for test benches.

This waveform generation board is an end-of-life legacy NI hardware. We supply fully inspected and tested refurbished units for replacement and upgrade of old automated test systems. It can be paired with NI acquisition cards to form a complete closed-loop stimulus and measurement system. It is widely adopted in automotive electronics laboratories, semiconductor test stations, university research platforms and industrial control simulation projects. As a high density voltage stimulus device, it provides reliable multi-channel synchronized analog output for long-term test and validation tasks.